Estimating and planning accelerated life test using constant stress for generalized logistic distribution under type-I censoring

DOI10.5402/2011/203618zbMATH Open1237.62136OpenAlexW2095592569WikidataQ58689070 ScholiaQ58689070MaRDI QIDQ420157FDOQ420157

Authors: Ahmed F. Attia, S. O. Bleed, H. M. Aly 

Publication date: 21 May 2012

Published in: ISRN Applied Mathematics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.5402/2011/203618

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Mathematics Subject Classification ID

Censored data models (62N01) Reliability and life testing (62N05) Optimal statistical designs (62K05)

Cites Work

• Title not available (Why is that?)
• Accelerated Testing
• On the distribution of order statistics from generalized logistic samples
• Estimation of asymptotic variances of quantiles for the generalized logistic distribution
• A generalized logistic distribution
• TL-moments and L-moments estimation of the generalized logistic distribution
• On the analysis of accelerated life-testing experiments
• Properties of the MLE for parameters of a Weibull regression model under type I censoring
• Accelerated life test sampling plans for the Weibull distribution under Type I progressive interval censoring with random removals
• Confidence Limits for Weibull Regression With Censored Data
• Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
• Estimation of the parameters of pareto distribution and the reliability function usin accelerated life testing with censoring
• Estimation of the generalized logistic distribution parameters: comparative study
• On the Weibull-Gamma frailty model, its infinite moments, and its connection to generalized log-logistic, logistic, Cauchy, and extreme-value distributions

Cited In (6)

• On constant stress accelerated life tests terminated by type II censoring at one of the stress levels
• Design and analysis of accelerated life testing and its application under rebate warranty. Accelerated life testing
• Estimation and optimal plans of multiple ramp-stress accelerated life tests for the generalized half-normal distribution
• Title not available (Why is that?)
• Title not available (Why is that?)
• Accelerated life testing and its application in the field of warranty policy under type-I censoring scheme

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