Localization length exponent, critical conductance distribution and multifractality in hierarchical network models for the quantum hall effect

DOI10.1002/ANDP.2090070303zbMATH Open0919.58056arXivcond-mat/9805063OpenAlexW2954078693MaRDI QIDQ4240774FDOQ4240774

Authors: Andreas Weymer, Martin Janssen 

Publication date: 7 September 1999

Published in: Annalen der Physik (Search for Journal in Brave)

Abstract: We study hierarchical network models which have recently been introduced to approximate the Chalker-Coddington model for the integer quantum Hall effect (A.G. Galstyan and M.E. Raikh, PRB 56 1422 (1997); Arovas et al., PRB 56, 4751 (1997)). The hierarchical structure is due to a recursive method starting from a finite elementary cell. The localization-delocalization transition occurring in these models is displayed in the flow of the conductance distribution under increasing system size. We numerically determine this flow, calculate the critical conductance distribution, the critical exponent of the localization length, and the multifractal exponents of critical eigenstates.

Full work available at URL: https://arxiv.org/abs/cond-mat/9805063

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zbMATH Keywords

hierarchical structurecritical exponentChalker-Coddington modelinteger quantum Hall effectlocalization-delocalizationmultifractal exponents of critical eigenstates

Mathematics Subject Classification ID

Renormalization group methods applied to problems in quantum field theory (81T17) Many-body theory; quantum Hall effect (81V70) Applications of dynamical systems (37N99)

Cited In (5)

• Dynamical localization of the Chalker-Coddington model far from transition
• Hierarchy-induced isotropy - anisosotropy transition on a fractal resistor network
• Localization properties of the Chalker-Coddington model
• Exact evaluation of the causal spectrum and localization properties of electronic states on a scale-free network
• Quantum critical Hall exponents

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