Identification of flaws using eddy current testing
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Publication:4255142
DOI10.1108/03321649810210802zbMATH Open0938.78014OpenAlexW2024601686MaRDI QIDQ4255142FDOQ4255142
Authors: Ryszard Sikora, Tomasz Chady, Stanislaw Gratkowski, Mieczysław Komorowski 
Publication date: 23 September 1999
Published in: COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1108/03321649810210802
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- Dynamical analysis for flaw shape identification in non linear eddy current tests
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- Eddy current canonical problems (with applications to nondestructive evaluation)
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