Optimal acceptance sampling plans for log-location-scale lifetime models using average risks
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Publication:425684
DOI10.1016/j.csda.2011.09.020zbMath1239.62147OpenAlexW2008077877MaRDI QIDQ425684
Arturo J. Fernández, Carlos J. Pérez-González
Publication date: 8 June 2012
Published in: Computational Statistics and Data Analysis (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.csda.2011.09.020
acceptable and rejectable quality levelsaverage producer and consumer risksfailure censoringreliability sampling plansWeibull and lognormal distributions
Related Items (14)
Optimal design of multivariate acceptance sampling plans by variables ⋮ Computation of optimum reliability acceptance sampling plans in presence of hybrid censoring ⋮ Optimum attributes component test plans for \(k\)-out-of-\(n:F\) Weibull systems using prior information ⋮ Minimizing the area of a Pareto confidence region ⋮ Generalized beta prior models on fraction defective in reliability test planning ⋮ Computing tolerance limits for the lifetime of a \(k\)-out-of-\(n\):\(F\) system based on prior information and censored data ⋮ Economic lot sampling inspection from defect counts with minimum conditional value-at-risk ⋮ Computing optimal confidence sets for Pareto models under progressive censoring ⋮ Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis ⋮ Efficient truncated repetitive lot inspection using Poisson defect counts and prior information ⋮ Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risks ⋮ Controlling posterior producer and consumer risks in lot reinspection ⋮ Optimal random sample size in progressively Type-II censoring based on cost constraint for the proportional hazards family ⋮ Optimal lot disposition from Poisson-Lindley count data
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