Publication:4272680
From MaRDI portal
zbMath0817.62041MaRDI QIDQ4272680
Mark A. Youngren, Nozer D. Singpurwalla
Publication date: 3 July 1995
reliability; exponential distribution; survival analysis; shock models; Poisson processes; Pareto distribution; gamma process; dependence; shot-noise process; damage accumulation; multivariate life distributions; failure models; new one parameter bivariate distribution
62H10: Multivariate distribution of statistics
60G99: Stochastic processes
62N05: Reliability and life testing
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