Finding all solutions of piecewise-linear resistive circuits using simple sign tests

DOI10.1109/81.242330zbMath0806.94030OpenAlexW2008355376MaRDI QIDQ4307891

Kiyotaka Yamamura

Publication date: 19 February 1995

Published in: IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/81.242330

zbMATH Keywords

algorithmcomputational complexitysign testssimultaneous linear equationspiecewise-linear resistive circuits

Mathematics Subject Classification ID

Analysis of algorithms and problem complexity (68Q25) Analytic circuit theory (94C05)

Related Items (4)

An interval method for global non‐linear dc circuit analysis ⋮ Interval solution of nonlinear equations using linear programming ⋮ Unnamed Item ⋮ Finding all solutions of a class of nonlinear equations using an improved LP test

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