Testing Uniformity Via Log-Spline Modeling

DOI10.1080/02331889708802555zbMath1077.62515OpenAlexW2034856635MaRDI QIDQ4331857

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Publication date: 12 February 1997

Published in: Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02331889708802555

Mathematics Subject Classification ID

Nonparametric hypothesis testing (62G10) Asymptotic distribution theory in statistics (62E20)

Related Items (5)

Dyadic diagonalization of positive definite band matrices and efficient \(B\)-spline orthogonalization ⋮ On large deviation theorem for data-driven Neyman's statistic ⋮ Maximum likelihood estimation for discrete exponential families and random graphs ⋮ Data-driven smooth tests for a location-scale family revisited ⋮ On Existence of Maximum Likelihood Estimators in Exponential Families

Cites Work

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• Pearson's X 2 and the Loglikelihood Ratio Statistic G 2 : A Comparative Review
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• On Sums of Random Vectors
• Data-Driven Version of Neyman's Smooth Test of Fit
• Testing goodness of fit via nonparametric function estimation techniques
• Data driven versions of pearson's chisquare test for uniformity
• On the Choice of the Number of Class Intervals in the Application of the Chi Square Test

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