A Semiparametric Extension of the Mann-Whitney Test for Randomly Truncated Data

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Publication:4348972

DOI10.2307/2533140zbMath0874.62042OpenAlexW2323057195WikidataQ36834269 ScholiaQ36834269MaRDI QIDQ4348972

Mei-Cheng Wang, Warren B. Bilker

Publication date: 9 November 1997

Published in: Biometrics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.2307/2533140




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