Progressively first-failure censored reliability sampling plans with cost constraint
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Publication:435002
DOI10.1016/J.CSDA.2011.12.008zbMATH Open1243.62128OpenAlexW2039723952MaRDI QIDQ435002FDOQ435002
Publication date: 16 July 2012
Published in: Computational Statistics and Data Analysis (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.csda.2011.12.008
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Weibull distributionmaximum likelihood methodacceptance samplingoperating characteristic curveexpected test time
Point estimation (62F10) Censored data models (62N01) Estimation in survival analysis and censored data (62N02) Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30) Monte Carlo methods (65C05)
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- Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals
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Cited In (12)
- Inference for the Chen distribution under progressive first-failure censoring
- Block censoring scheme with two-parameter exponential distribution
- Reliability sampling plans for a lognormal distribution under progressive first-failure censoring with cost constraint
- Failure–censored reliability sampling plans for the exponential distribution
- Optimum reliability acceptance sampling plans under progressive type-I interval censoring with random removal using a cost model
- Estimating the entropy of a Rayleigh model under progressive first-failure censoring
- Computation of optimum reliability acceptance sampling plans in presence of hybrid censoring
- Optimal random sample size based on Bayesian prediction of exponential lifetime and application to real data
- Reliability analysis based on progressively first-failure-censored samples for the proportional hazard rate model
- Interval estimation for the generalized inverted exponential distribution under progressive first failure censoring
- Cost-effective optimization strategies and sampling plan for Weibull quantiles under type-II censoring
- Progressively censored reliability sampling plans based on mean product lifetime
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