The Signed Root Deviance Profile and Confidence Intervals in Maximum Likelihood Analysis
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Publication:4365997
DOI10.2307/2291718zbMath0882.62026OpenAlexW4238445498MaRDI QIDQ4365997
Jianshen Chen, Robert I. Jennrich
Publication date: 5 March 1998
Full work available at URL: https://doi.org/10.2307/2291718
constrained optimizationdifferential equationstransformationsdiagnosticsprofile likelihoodlikelihood ratio intervalslinear approximation intervalsprofile \(t\) plot
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