Minimum cost component test plans for evaluating reliability of a highly reliable parallel system
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Publication:4367281
DOI10.1002/(SICI)1520-6750(199708)44:5%3C401::AID-NAV1%3E3.0.CO;2-8zbMATH Open0890.90074OpenAlexW2049082014MaRDI QIDQ4367281FDOQ4367281
Mainak Mazumdar, Jayant Rajgopal
Publication date: 25 November 1997
Full work available at URL: https://doi.org/10.1002/(sici)1520-6750(199708)44:5%3C401::aid-nav1%3E3.0.co;2-8
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- Two-stage component test plans for testing the reliability of a series system
- Optimal component test plans for a parallel system based on type-II censoring
- Design of component reliability test plan for a series system having time dependent testing cost with the presence of covariates
- Optimum attributes component test plans for \(k\)-out-of-\(n:F\) Weibull systems using prior information
- Minimum average cost testing for partially ordered components
- The reliability of a test procedure for identifying defective components
- Reliability Test Plans for Series Systems in the Presence of Covariates
- Optimal redesign decisions through failure rate estimates
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