PREDICTION FOR EXPONENTIAL LIFETIMES BASED ON STEP-STRESS TESTING
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Publication:4416940
DOI10.1081/SAC-120004311zbMath1079.62548MaRDI QIDQ4416940
George A. Milliken, Chengjie Xiong
Publication date: 5 August 2003
Published in: Communications in Statistics: Simulation and Computation (Search for Journal in Brave)
CalibrationExponential distributionMaximum likelihood estimate (MLE)Step stressAccelerated life testing (ALT)Prediction interval (region)Type I \& II censoring
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Maximum precision estimation for a step-stress model using two-stage methodologies ⋮ Prediction of censored exponential lifetimes in a simple step-stress model under progressive type II censoring ⋮ Bayesian prediction for type-II progressive-censored data from the Rayleigh distribution under progressive-stress model
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