scientific article; zbMATH DE number 2061185

zbMATH Open1046.62112MaRDI QIDQ4457046FDOQ4457046

Authors: Qiguang Wu, Yonghui Zhao, Guoying Li 

Publication date: 21 March 2004

Title of this publication is not available (Why is that?)

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zbMATH Keywords

exponential distributionreliability growth test

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05) Characterization and structure theory of statistical distributions (62E10)

Cited In (2)

• ON BAYESIAN ANALYSIS OF BINOMIAL RELIABILITY GROWTH
• A new lifetime exponential-\(X\) family of distributions with applications to reliability data

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