Simple regression in view of elliptical models
DOI10.1016/J.LAA.2012.05.008zbMATH Open1348.62185OpenAlexW2079231220MaRDI QIDQ445829FDOQ445829
Authors: M. Arashi, S. M. M. Tabatabaey, H. Soleimani
Publication date: 27 August 2012
Published in: Linear Algebra and its Applications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.laa.2012.05.008
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shrinkage estimatorelliptically contoured distributionpreliminary test estimatorsimple linear regression
Point estimation (62F10) Linear regression; mixed models (62J05) Estimation in multivariate analysis (62H12)
Cites Work
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- Nonparametric estimation of location parameter after a preliminary test on regression
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- On mathematical characteristics of some improved estimators of the mean and variance components in elliptically contoured models
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- Performance of the shrinkage preliminary test ridge regression estimators based on the conflicting of W, LR and LM tests
- Estimation of the Parameters of two Parallel Regression Lines Under Uncertain Prior Information
Cited In (8)
- Simplified R-vine based forward regression
- Estimation of parameters of parallelism model with elliptically distributed errors
- Ridge estimation in semi-parametric regression models under the stochastic restriction and correlated elliptically contoured errors
- A ridge regression estimation approach to the measurement error model
- Shrinkage ridge estimators in semiparametric regression models
- Elliptical regression operationalized
- Using Improved Robust Estimators to Semiparametric Model with High Dimensional Data
- Some improved estimation strategies in high-dimensional semiparametric regression models with application to riboflavin production data
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