Non-linear analog circuit fault diagnosis with large change sensitivity

DOI10.1002/(SICI)1097-007X(200005/06)28:3%3C281::AID-CTA109%3E3.0.CO;2-NMaRDI QIDQ4458668zbMATH OpenOpenAlexFDO

Authors Matthew Worsman, Mike W. T. Wong

Publication date 15 March 2004

Full work available at URL https://doi.org/10.1002/(sici)1097-007x(200005/06)28:3%3C281::aid-cta109%3E3.0.co;2-n

zbMATH Keywords

fault dictionarylarge change sensitivitynonlinear analog circuits

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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Cites work

• An Algorithm for Solving Nonlinear Resistor Networks

Cited in

(7)

• Digital to analog converter nonlinear test
• Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach
• Wavelet neural network based fault diagnosis in nonlinear analog circuits
• Improved analogue fault coverage estimation using probabilistic analysis
• LIMSoft: automated tool for sensitivity analysis and test vector generation
• scientific article; zbMATH DE number 37856 (Why is no real title available?)
• Advanced methods for equivalence checking of analog circuits with strong nonlinearities

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