Non-linear analog circuit fault diagnosis with large change sensitivity

DOI10.1002/(SICI)1097-007X(200005/06)28:3%3C281::AID-CTA109%3E3.0.CO;2-NMaRDI QIDQ4458668zbMATH OpenOpenAlexFDO

Authors Matthew Worsman, Mike W. T. Wong

Publication date 15 March 2004

Full work available at URL https://doi.org/10.1002/(sici)1097-007x(200005/06)28:3%3C281::aid-cta109%3E3.0.co;2-n

zbMATH Keywords

nonlinear analog circuitsfault dictionarylarge change sensitivity

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Recommendations

• A theory and an algorithm for analog circuit fault diagnosis
• Wavelet neural network based fault diagnosis in nonlinear analog circuits
• An algorithm for multiple fault diagnosis in analogue circuits
• Nonlinear fault diagnosis. A new theory and implementation
• Fault diagnosis of nonlinear analog circuits based on Volterra frequency domain kernel identification

Cites work

• An Algorithm for Solving Nonlinear Resistor Networks

Cited in

(4)

• Digital to analog converter nonlinear test
• Improved analogue fault coverage estimation using probabilistic analysis
• Advanced methods for equivalence checking of analog circuits with strong nonlinearities
• Wavelet neural network based fault diagnosis in nonlinear analog circuits

This page was built for publication: Non-linear analog circuit fault diagnosis with large change sensitivity

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4458668)