Non-linear analog circuit fault diagnosis with large change sensitivity

DOI10.1002/(SICI)1097-007X(200005/06)28:3%3C281::AID-CTA109%3E3.0.CO;2-NzbMATH Open1037.94564OpenAlexW1990117314MaRDI QIDQ4458668FDOQ4458668

Authors: Matthew Worsman, Mike W. T. Wong 

Publication date: 15 March 2004

Full work available at URL: https://doi.org/10.1002/(sici)1097-007x(200005/06)28:3%3C281::aid-cta109%3E3.0.co;2-n

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zbMATH Keywords

nonlinear analog circuitsfault dictionarylarge change sensitivity

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites Work

• An Algorithm for Solving Nonlinear Resistor Networks

Cited In (4)

• Digital to analog converter nonlinear test
• Wavelet neural network based fault diagnosis in nonlinear analog circuits
• Advanced methods for equivalence checking of analog circuits with strong nonlinearities
• Improved analogue fault coverage estimation using probabilistic analysis

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