Analysis of x-ray diffraction data using a hybrid stochastic optimization method

DOI10.1088/0305-4470/35/17/304zbMATH Open1042.94511OpenAlexW2161232747MaRDI QIDQ4465663FDOQ4465663

Jose Torres-Jimenez, J. C. Ruiz-Suárez, Marcos C. Vargas

Publication date: 9 June 2004

Published in: Journal of Physics A: Mathematical and General (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1088/0305-4470/35/17/304

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zbMATH Keywords

optimizationstochastic algorithmsdiffraction signal processing

Mathematics Subject Classification ID

Signal theory (characterization, reconstruction, filtering, etc.) (94A12) Stochastic programming (90C15) Statistical mechanics of crystals (82D25)

Cited In (4)

• Optimal polyhedral description of 3D polycrystals: method and application to statistical and synchrotron X-ray diffraction data
• Detecting the Guttman effect with the help of ordinal correspondence analysis in synchrotron X-ray diffraction data analysis
• Application of genetic algorithms for the optimization of X-ray waveguides
• Stochastic algorithms for solving linear and nonlinear inverse ill-posed problems for particle size retrieving and x-ray diffraction analysis of epitaxial films

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