On Variograms in Point Process Statistics, II: Models of Markings and Ecological Interpretation

DOI10.1002/(SICI)1521-4036(200005)42:2%3C171::AID-BIMJ171%3E3.0.CO;2-LMaRDI QIDQ4488928zbMATH OpenOpenAlexFDO

Authors Dietrich Stoyan, Olga Waelder

Publication date 2 September 2001

Full work available at URL https://doi.org/10.1002/(sici)1521-4036(200005)42:2%3C171::aid-bimj171%3E3.0.co;2-l

zbMATH Keywords

interactionPoisson point processenvironmental factorsrandom field modelmark variogramMatern cluster point processpinesspruces

Mathematics Subject Classification ID

Inference from spatial processes (62M30) Random fields; image analysis (62M40) Applications of statistics to environmental and related topics (62P12)

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Cites work

• scientific article; zbMATH DE number 1235906 (Why is no real title available?)
• scientific article; zbMATH DE number 3892434 (Why is no real title available?)
• Estimating Pair Correlation Functions of Planar Cluster Processes
• On Variograms in Point Process Statistics

Cited in

(13)

• Analysing Multivariate Spatial Point Processes with Continuous Marks: A Graphical Modelling Approach
• Conditionally heteroscedastic intensity-dependent marking of log Gaussian Cox processes
• Detecting Dependence Between Marks and Locations of Marked Point Processes
• Modelling tree roots in mixed forest stands by inhomogeneous marked Gibbs point processes
• Bayesian modeling on continuously marked spatial point patterns
• Tests for Independence between Marks and Points of a Marked Point Process
• On statistical inference for the random set generated Cox process with set-marking
• Mechanistic spatio-temporal point process models for marked point processes, with a view to forest stand data
• The multi-scale marked area-interaction point processes: a model for the spatial pattern of trees
• Modelling forest dynamics: a perspective from point process methods
• On asymptotic properties of the mark variogram estimator of a marked point process
• Simulating correlated marked-point processes
• Second-order characteristics of spatial marked processes with applications

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