On a generalization of test ideals
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Publication:4652216
DOI10.1017/S0027763000008904zbMath1094.13004arXivmath/0210131MaRDI QIDQ4652216
Publication date: 24 February 2005
Published in: Nagoya Mathematical Journal (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/math/0210131
13A35: Characteristic (p) methods (Frobenius endomorphism) and reduction to characteristic (p); tight closure
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Cites Work
- Adjoints of ideals in regular local rings (with an appendix by Steven Dale Cutkosky)
- Coefficient ideals and the Cohen-Macaulay property of Rees algebras
- On the commutation of the test ideal with localization and completion
- Some results on test elements
- F-regular and F-pure rings vs. log terminal and log canonical singularities
- A generalization of tight closure and multiplier ideals
- An interpretation of multiplier ideals via tight closure
- Strong and weak F -regularity are equivalent for graded rings
- A subadditivity property of multiplier ideals.
- Behavior of test ideals under smooth and étale homomorphisms.
