Repulsive Interaction of Néel Walls, and the Internal Length Scale of the Cross-Tie Wall

DOI10.1137/S1540345902402734zbMath1059.82046WikidataQ59202313 ScholiaQ59202313MaRDI QIDQ4653954

Felix Otto, Robert V. Kohn, Stefan Müller, Antonio De Simone

Publication date: 1 March 2005

Published in: Multiscale Modeling & Simulation (Search for Journal in Brave)

zbMATH Keywords

micromagnetics; thin films; Néel wall; cross-tie wall

Mathematics Subject Classification ID

82D40: Statistical mechanics of magnetic materials

82C24: Interface problems; diffusion-limited aggregation in time-dependent statistical mechanics

78M35: Asymptotic analysis in optics and electromagnetic theory

78M30: Variational methods applied to problems in optics and electromagnetic theory

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