Goodness-of-Fit Tests for GEE Modeling with Binary Responses

DOI10.2307/3109778zbMath1058.62524WikidataQ52241424 ScholiaQ52241424MaRDI QIDQ4666009

Huiman X. Barnhart, John M. Williamson

Publication date: 11 April 2005

Published in: Biometrics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.2307/3109778

zbMATH Keywords

score test; logistic regression; goodness-of-fit test; correlated data; GEE modeling

Mathematics Subject Classification ID

62G10: Nonparametric hypothesis testing

62G20: Asymptotic properties of nonparametric inference

62G35: Nonparametric robustness

62P10: Applications of statistics to biology and medical sciences; meta analysis

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