Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
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Publication:4671324
DOI10.1080/00207540410001716480zbMath1060.90595OpenAlexW2163233725MaRDI QIDQ4671324
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Publication date: 26 April 2005
Published in: International Journal of Production Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/00207540410001716480
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