A survey of methods used to control piezoelectric tube scanners in high-speed AFM imaging

DOI10.1002/ASJC.1728zbMATH Open1397.93155OpenAlexW2792502737MaRDI QIDQ4683402FDOQ4683402

Authors: Md. Sohel Rana, Hemanshu R. Pota, Ian R. Petersen 

Publication date: 21 September 2018

Published in: Asian Journal of Control (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/asjc.1728

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zbMATH Keywords

nanotechnologyatomic force microscopelimiting factorspiezoelectric tube scanner

Mathematics Subject Classification ID

Feedback control (93B52) Application models in control theory (93C95)

Cited In (7)

• The design of model predictive control for an AFM and its impact on piezo nonlinearities
• Robust and guaranteed output-feedback force control of piezoelectric actuator under temperature variation and input constraints
• Fractional-order sliding mode control for a novel magneto-electro-elastic microtube robot
• Effect of improved tracking for atomic force microscope on piezo nonlinear behavior
• A comparison of scanning methods and the vertical control implications for scanning probe microscopy
• Biophysical applications of scanning ion conductance microscopy (SICM)
• A novel application of minimax LQG control technique for high-speed spiral imaging

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