A survey of methods used to control piezoelectric tube scanners in high-speed AFM imaging

DOI10.1002/ASJC.1728MaRDI QIDQ4683402zbMATH OpenOpenAlexFDO

Authors Md. Sohel Rana, Hemanshu R. Pota, Ian R. Petersen

Publication date 21 September 2018

Published in Asian Journal of Control (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1002/asjc.1728

zbMATH Keywords

nanotechnologyatomic force microscopelimiting factorspiezoelectric tube scanner

Mathematics Subject Classification ID

Feedback control (93B52) Application models in control theory (93C95)

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(7)

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• The design of model predictive control for an AFM and its impact on piezo nonlinearities
• Robust and guaranteed output-feedback force control of piezoelectric actuator under temperature variation and input constraints
• Fractional-order sliding mode control for a novel magneto-electro-elastic microtube robot
• Effect of improved tracking for atomic force microscope on piezo nonlinear behavior
• A comparison of scanning methods and the vertical control implications for scanning probe microscopy
• Biophysical applications of scanning ion conductance microscopy (SICM)

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