Detection of electromagnetic inclusions using topological sensitivity

DOI10.4208/JCM.1609-M2016-0498zbMATH Open1413.35284arXiv1607.03419OpenAlexW3098043313MaRDI QIDQ4688152FDOQ4688152

Authors: Abdul Wahab, Tasawar Abbas, Naveed Ahmed, Qazi Muhammad Zaigham Zia 

Publication date: 22 October 2018

Published in: Journal of Computational Mathematics (Search for Journal in Brave)

Abstract: In this article a topological sensitivity framework for far field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of its resolution and sensitivity for locating an inclusion. The stability of the framework with respect to measurement and medium noises is discussed. Moreover, the quantitative results for signal-to-noise ratio are presented. A few numerical results are presented to illustrate the detection capabilities of the proposed framework with single and multiple measurements.

Full work available at URL: https://arxiv.org/abs/1607.03419

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zbMATH Keywords

localizationmeasurement noisestability analysistopological derivativeresolution analysismedium noiseelectromagnetic imaging

Mathematics Subject Classification ID

Wave equation (35L05) Inverse problems for PDEs (35R30)

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• Towards flaw detection in welding joints via multi-frequency topological derivative methods
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