Optimal design of accelerated life tests with two stresses

DOI10.1002/(SICI)1520-6750(199609)43:6%3C863::AID-NAV5%3E3.0.CO;2-2MaRDI QIDQ4715985zbMATH OpenOpenAlexFDO

Authors Jung-Won Park, Bong-Jin Yum

Publication date 23 March 1997

Full work available at URL https://doi.org/10.1002/(sici)1520-6750(199609)43:6%3C863::aid-nav5%3E3.0.co;2-2

zbMATH Keywords

maximum-likelihood estimatoraccelerated life test planstwo stresses

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25)

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Cited in

(8)

• Design of bivariate accelerated life tests with one main effect and one interaction effect for log-location-scale distributions
• Planning step-stress accelerated life tests with two experimental factors for exponential distributions and type I censoring
• Optimum design of accelerated life test plans for Weibull life distributions
• Planning accelerated life tests with random effects of test chambers
• scientific article; zbMATH DE number 6163340 (Why is no real title available?)
• Robust Design of Accelerated Life Testing and Reliability Optimization: Response Surface Methodology Approach
• Optimality in Accelerated Life Tests
• Optimal designs for accelerated life tests with multiple stress factors and heteroscedasticity

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