Optimal design of accelerated life tests with two stresses
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Publication:4715985
DOI10.1002/(SICI)1520-6750(199609)43:6%3C863::AID-NAV5%3E3.0.CO;2-2zbMATH Open0858.90063OpenAlexW2107185466MaRDI QIDQ4715985FDOQ4715985
Authors: Jung-Won Park, Bong-Jin Yum 
Publication date: 23 March 1997
Full work available at URL: https://doi.org/10.1002/(sici)1520-6750(199609)43:6%3C863::aid-nav5%3E3.0.co;2-2
Recommendations
- Optimal design of accelerated life tests under modified stress loading methods
- Optimal designs for accelerated life tests with multiple stress factors and heteroscedasticity
- Optimal design of accelerated life tests under periodic inspection
- Design of accelerated life testing plans under multiple stresses
- Optimum design for type-I step-stress accelerated life tests of two-parameter Weibull distributions
- Optimal design of step-stress accelerated life testing with progressive censoring
Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25)
Cited In (8)
- Planning step-stress accelerated life tests with two experimental factors for exponential distributions and type I censoring
- Optimal designs for accelerated life tests with multiple stress factors and heteroscedasticity
- Planning accelerated life tests with random effects of test chambers
- Optimality in Accelerated Life Tests
- Optimum design of accelerated life test plans for Weibull life distributions
- Title not available (Why is that?)
- Robust Design of Accelerated Life Testing and Reliability Optimization: Response Surface Methodology Approach
- Design of bivariate accelerated life tests with one main effect and one interaction effect for log-location-scale distributions
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