On Finding a Single Defective in Binomial Group Testing

DOI10.2307/2285513zbMATH Open0284.62049OpenAlexW4247602753MaRDI QIDQ4772036FDOQ4772036

Authors: Frank K. Hwang 

Publication date: 1974

Full work available at URL: https://doi.org/10.2307/2285513

Mathematics Subject Classification ID

Parametric hypothesis testing (62F03) Applications of statistics in engineering and industry; control charts (62P30) Optimal statistical designs (62K05) Combinatorial probability (60C05) Designs and configurations (05B99)

Cited In (5)

• On optimal nested group testing algorithms
• An explicit expression for the cost of a class of Huffman trees
• Optimal Dorfman group testing for symmetric distributions
• Huffman-type codes for infinite source distributions
• A combinatorial approach to Golomb forests

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