Patterns in pattern recognition: 1968-1974
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Publication:4773323
DOI10.1109/TIT.1974.1055306zbMATH Open0286.68055MaRDI QIDQ4773323FDOQ4773323
Authors: Laveen N. Kanal
Publication date: 1974
Published in: IEEE Transactions on Information Theory (Search for Journal in Brave)
Research exposition (monographs, survey articles) pertaining to computer science (68-02) Pattern recognition, speech recognition (68T10)
Cited In (29)
- Additive estimators for probabilities of correct classification
- Feature definition in pattern recognition with small sample size
- Estimating the Posterior Probabilities Using the K-Nearest Neighbor Rule
- Problems in pattern classification in high dimensional spaces: Behavior of a class of combined neuro-fuzzy classifiers
- Title not available (Why is that?)
- Current and past roles of the statistician in space applications
- On the optimal number of features in the classification of multivariate Gaussian data
- A class of lower bounds on the Bayesian probability of error
- Title not available (Why is that?)
- An algorithm for determining identity of nearest-neighbor and potential function decision rules
- Using a bicriteria Boolean linear programming model for parameter selection in large multicategory classification problem
- Classification and Discrimination Problems with Applications, Part IIa
- An efficient estimator of pattern recognition system error probability
- Generalized divergence measures and the probability of error
- Pattern recognition by means of disjoint principal components models
- On information and distance measures, error bounds, and feature selection
- Nonparametric iterative estimation of multivariate binary density
- Some aspects of error bounds in feature selection
- The use of context in pattern recognition
- Mahalanobis distance-based two new feature evaluation criteria
- Discrimination and classification: Overview
- Distance preserving linear feature selection
- A model for dimension reduction in pattern recognition using continuous data
- Linear feature selection with applications
- An application of formal linguistics to scene recognition
- Linear dimension reduction and Bayes classification
- An overtraining-resistant stochastic modeling method for pattern recognition
- Trigonometric entropies, Jensen difference divergence measures, and error bounds
- Cluster analysis by adaptive rank-order filters
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