scientific article; zbMATH DE number 1858045
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Publication:4789016
zbMATH Open1020.90031MaRDI QIDQ4789016FDOQ4789016
Authors: Ye Boon Yun, H. Nakayama, Tetsuzo Tanino 
Publication date: 14 April 2003
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- A bi-objective generalized data envelopment analysis model and point-to-set mapping projection
- A generalized model for data envelopment analysis
- A geometrical approach for generalizing the production possibility set in DEA
- On some generalization of the DEA models
- Dual productivity analysis: a Konüs/Shephard approach
- Construction of all DEA efficient surfaces of the production possibility set under the Generalized Data Development Analysis model
- Measuring the productivity changes with double frontiers data envelopment analysis for two-stage processes
- The generalized range adjusted measure in data envelopment analysis: properties, computational aspects and duality
- The data envelopment analysis model with intersection form production possibility set
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