ESTIMATION OFCpFOR AUTOCORRELATED DATA AND MEASUREMENT ERRORS
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Publication:4792118
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- scientific article; zbMATH DE number 1455588
Cites work
- scientific article; zbMATH DE number 9266 (Why is no real title available?)
- scientific article; zbMATH DE number 1461443 (Why is no real title available?)
- scientific article; zbMATH DE number 952740 (Why is no real title available?)
- scientific article; zbMATH DE number 1418971 (Why is no real title available?)
- Estimating process capability indexes for autocorrelated data
- On the asymptotic distributions of some process capability indices.
- On the distributions of the estimated process capability indices
Cited in
(10)- Optimal skip-lot sampling plan based on the yield index for auto-correlated data
- Estimating total and specific process capability indices in three-stage processes with measurement errors
- Inference on \(C_{\mathrm{pk}}\) for autocorrelated data in the presence of random measurement errors
- Using a novel approach to assess process performance in the presence of measurement errors
- A combined mixed-s-skip sampling strategy to reduce the effect of autocorrelation on the X̄ scheme with and without measurement errors
- Basic process capability indices: an expository review
- The new synthetic and runs-rules schemes to monitor the process mean of autocorrelated observations with measurement errors
- Multivariate process capability using principal component analysis in the presence of measurement errors
- Design of measurement difference autocovariance method for estimation of process and measurement noise covariances
- Measuring one-sided process capability index for autocorrelated data in the presence of random measurement errors
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