Thin-film-growth models: roughness and correlation functions

DOI10.1017/S0956792502004886zbMath1020.82014MaRDI QIDQ4797278

Christoph Gugg, Martin Raible, Dirk Blömker

Publication date: 25 June 2003

Published in: European Journal of Applied Mathematics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1017/s0956792502004886

Mathematics Subject Classification ID

65N35: Spectral, collocation and related methods for boundary value problems involving PDEs

65M60: Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs

60H15: Stochastic partial differential equations (aspects of stochastic analysis)

35R60: PDEs with randomness, stochastic partial differential equations

60H35: Computational methods for stochastic equations (aspects of stochastic analysis)

82C24: Interface problems; diffusion-limited aggregation in time-dependent statistical mechanics

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