scientific article; zbMATH DE number 1909483

zbMATH Open1025.94026MaRDI QIDQ4805355FDOQ4805355

Authors: Nicola Nicolici, Bashir M. Al-Hashimi 

Publication date: 13 May 2003

Title of this publication is not available (Why is that?)

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zbMATH Keywords

power dissipationpower constraintscomplex circuitsmultiple scan chains

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15) Fault detection; testing in circuits and networks (94C12)

Cited In (4)

• Test schedules for VLSI circuits having built-in test hardware
• The monotonic increasing relationship between average powers of CMOS VLSI circuits with and without delay and its applications
• Energy saving testing of circuits
• NBTI and power reduction using an input vector control and supply voltage assignment method

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