scientific article; zbMATH DE number 1909483

MaRDI QIDQ4805355zbMATH OpenFDO

Authors Nicola Nicolici, Bashir M. Al-Hashimi

Publication date 13 May 2003

zbMATH Keywords

power dissipationpower constraintscomplex circuitsmultiple scan chains

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15) Fault detection; testing in circuits and networks (94C12)

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(4)

• Test schedules for VLSI circuits having built-in test hardware
• The monotonic increasing relationship between average powers of CMOS VLSI circuits with and without delay and its applications
• Energy saving testing of circuits
• NBTI and power reduction using an input vector control and supply voltage assignment method

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