Complete Electrode Model of Electrical Impedance Tomography: Approximation Properties and Characterization of Inclusions

DOI10.1137/S0036139903423303zbMath1059.35168MaRDI QIDQ4830565

Nuutti Hyvönen

Publication date: 13 December 2004

Published in: SIAM Journal on Applied Mathematics (Search for Journal in Brave)

zbMATH Keywords

inclusionsNeumann-to-Dirichlet mapnondestructive testingcurrent-to-voltage mapspatial admittance distribution

Mathematics Subject Classification ID

Boundary value problems for second-order elliptic equations (35J25) PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)

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