T-Scan Electrical Impedance Imaging System for Anomaly Detection

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Publication:4830643

DOI10.1137/S003613990343375XzbMath1075.35102OpenAlexW2052396592MaRDI QIDQ4830643

Eung Je Woo, Oh In Kwon, Jin-Keun Seo, Habib Ammari

Publication date: 13 December 2004

Published in: SIAM Journal on Applied Mathematics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1137/s003613990343375x




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