T-Scan Electrical Impedance Imaging System for Anomaly Detection
DOI10.1137/S003613990343375XzbMATH Open1075.35102OpenAlexW2052396592MaRDI QIDQ4830643FDOQ4830643
Eung Je Woo, Oh In Kwon, Jin Keun Seo, Habib Ammari
Publication date: 13 December 2004
Published in: SIAM Journal on Applied Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1137/s003613990343375x
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- Identifying active anomalies in a multilayered medium by passive measurement in EIT
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- Shape recognition and classification in electro-sensing
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- The method of fundamental solutions for the inverse conductivity problem
- Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems
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