scientific article; zbMATH DE number 770395
From MaRDI portal
Publication:4838100
Recommendations
- On the numerical solution of the inverse problem of X-ray diffraction optics
- The inverse problem of estimating the film structure from X-ray reflection data
- The Patterson function of superstructures: anomalous dispersion effect
- Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering
- scientific article; zbMATH DE number 1069552
Cited in
(3)- Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering
- Intensive X-ray standing-wave-like fields localized near a surface of a crystalline superlattice
- Stochastic algorithms for solving linear and nonlinear inverse ill-posed problems for particle size retrieving and x-ray diffraction analysis of epitaxial films
This page was built for publication:
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4838100)