Two-Stage Reliability Tests with Technological Evolution: A Bayesian Analysis
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Publication:4844045
DOI10.2307/2986021zbMath0825.62718MaRDI QIDQ4844045
Karen D. S. Young, George A. Whitmore, Alan C. Kimber
Publication date: 17 August 1995
Published in: Applied Statistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.2307/2986021
reliability; Bayesian analysis; Poisson distribution; failure; gamma distribution; technology; inference; engineering design; demonstration tests; Siegel distribution