Identification of optical thin film systems with the method of phase reconstruction

DOI10.1088/0266-5611/12/1/006zbMATH Open0848.35141OpenAlexW2012172420MaRDI QIDQ4877435FDOQ4877435

Authors: Ronny Ramlau 

Publication date: 9 October 1996

Published in: Inverse Problems (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1088/0266-5611/12/1/006

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zbMATH Keywords

Schwarz formulareflecting coefficientoptical thin layers

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30)

Cited In (4)

• Simultaneous estimation of thin film thickness and optical properties using two-stage optimization
• Title not available (Why is that?)
• Title not available (Why is that?)
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