Software reliability model considering time-delay fault removal

DOI10.1007/978-1-84800-113-8_14MaRDI QIDQ4928877zbMATH OpenOpenAlexFDO

Authors Seheon Hwang, Hoang Hiep Pham

Publication date 19 June 2013

Published in Springer Series in Reliability Engineering (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/978-1-84800-113-8_14

Mathematics Subject Classification ID

Reliability and life testing (62N05) Theory of software (68N99)

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Cites work

• scientific article; zbMATH DE number 44279 (Why is no real title available?)
• A software cost model with imperfect debugging, random life cycle and penalty cost
• An imperfect debugging model with two types of hazard rates for software reliability measurement and assessment.
• Evaluation of debug-testing efficiency by duplication of the detected fault and delay time of repair
• Imperfect debugging models with fault introduction rate for software reliability assessment
• NHPP software reliability and cost models with testing coverage
• Software reliability assessment models based on cumulative Bernoulli trial processes
• Time-Dependent Error-Detection Rate Model for Software Reliability and Other Performance Measures

Cited in

(10)

• A new reliability model based on Lindley distribution with application to failure data
• Software reliability growth models
• Research of combined forecasting model for software reliability
• Quasi renewal analysis of software reliability growth model incorporating testing efforts and time delay
• Enhancing software reliability modeling and prediction through the introduction of time-variable fault reduction factor
• Flexible software reliability growth models for distributed systems
• Software reliability growth modeling for agile software development
• A new software reliability growth model: multigeneration faults and a power-law testing-effort function
• Software reliability modeling with removed errors and compounded-decreased-rate
• A software reliability growth model considering multiple real situations

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