Mobility edge and level statistics of random tight-binding Hamiltonians

DOI10.1088/0305-4470/31/28/012MaRDI QIDQ4950591zbMATH OpenOpenAlexFDO

Authors Fabio Siringo, Giovanni Piccitto

Publication date 9 April 2000

Published in Journal of Physics A: Mathematical and General (Search for Journal in Brave)

Full work available at URL https://arxiv.org/abs/cond-mat/9706127

zbMATH Keywords

critical exponentfinite-size scalingcubic latticemetal-insulator transitiontight-binding Hamiltonianmobility edgeenergy level spacing distributionfixed disorder strengthLorentzian distributed diagonal disorder

Mathematics Subject Classification ID

Statistical mechanics of random media, disordered materials (including liquid crystals and spin glasses) (82D30)

Abstract: The energy level spacing distribution of a tight-binding hamiltonian is monitored across the mobility edge for a fixed disorder strength. Any mixing of extended and localized levels is avoided in the configurational averages, thus approaching the critical point very closely and with high energy resolution. By finite size scaling the method is shown to provide a very accurate estimate of the mobility edge and of the critical exponent for a cubic lattice with lorentzian distributed diagonal disorder. Since no averaging in wide energy windows is required, the method appears as a powerful tool for locating the mobility edges in more complex models of real physical systems.

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• Classical representation of 1D tight-binding models

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