Abstract: We compute the persistence exponent of the integral of a stable L'evy process in terms of its self-similarity and positivity parameters. This solves a problem raised by Z. Shi (2003). Along the way, we investigate the law of the stable process L evaluated at the first time its integral X hits zero, when the bivariate process (X,L) starts from a coordinate axis. This extends classical formulae by McKean (1963) and Gor'kov (1975) for integrated Brownian motion.
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- Universality of the asymptotics of the one-sided exit problem for integrated processes
Cited in
(13)- Stochastic processes under constraints. Abstracts from the workshop held September 27 -- October 3, 2020 (hybrid meeting)
- Persistence and exit times for some additive functionals of skew Bessel processes
- The lower tail problem for homogeneous functionals of stable processes with no negative jumps
- Universality of the asymptotics of the one-sided exit problem for integrated processes
- Asymptotics of the persistence exponent of integrated fractional Brownian motion and fractionally integrated Brownian motion
- Record statistics of integrated random walks and the random acceleration process
- Persistence of some iterated processes
- Cramér's estimate for stable processes with power drift
- Persistence exponents for Gaussian random fields of fractional Brownian motion type
- The area of a spectrally positive stable process stopped at zero
- Persistence exponents via perturbation theory: autoregressive and moving average processes
- A stable Langevin model with diffusive-reflective boundary conditions
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