Joint modeling of linear degradation and failure time data with masked causes of failure under simple step-stress test

DOI10.1080/00949655.2018.1442468OpenAlexW2789883631WikidataQ130170924 ScholiaQ130170924MaRDI QIDQ4960631

F. Azizi, Firoozeh Haghighi

Publication date: 23 April 2020

Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00949655.2018.1442468

zbMATH Keywords

reliability functionexpectation-maximization algorithmintensitymasked datacause of failurelinear degradation path

Mathematics Subject Classification ID

Statistics (62-XX)

Related Items (1)

Analysis of masked competing risks data with cause and time dependent masking mechanism

Uses Software

• SPLIDA

Cites Work

• The Cox model and its applications
• Statistical analysis of linear degradation and failure time data with multiple failure modes
• Inference for the dependent competing risks model with masked causes of failure
• Joint modeling of degradation and failure time data
• Methods for the estimation of failure distributions and rates from automobile warranty data
• Bayesian Analysis of Masked Data in Step-stress Accelerated Life Testing
• Inference based on the EM algorithm for the competing risks model with masked causes of failure
• A tampered failure rate model for step-stress accelerated life test
• On the linear degradation model with multiple failure modes
• Statistical Analysis of General Degradation Path Model and Failure Time Data with Multiple Failure Modes
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