Depth-based runs tests for bivariate central symmetry
DOI10.1007/S10463-014-0480-YzbMATH Open1441.62122arXiv1401.2377OpenAlexW2123768985MaRDI QIDQ498055FDOQ498055
Authors: Rainer Dyckerhoff, Christophe Ley, Davy Paindaveine
Publication date: 25 September 2015
Published in: Annals of the Institute of Statistical Mathematics (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1401.2377
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Cited In (17)
- Optimal tests for elliptical symmetry: specified and unspecified location
- Adaptive positive and negative runs test
- Comparison of symmetry tests against some skew-symmetric alternatives in i.i.d. and non-i.i.d. setting
- Depth-based signed-rank tests for bivariate central symmetry
- Simplicial bivariate tests for randomness
- Non‐parametric depth‐based tests for the multivariate location problem
- Employing the MCMC technique to compute the projection depth in high dimensions
- Affine invariant integrated rank-weighted statistical depth: properties and finite sample analysis
- Choosing among notions of multivariate depth statistics
- Affine invariant depth-based tests for the multivariate one-sample location problem
- Some hypothesis tests based on random projection
- Explicit bivariate simplicial depth
- More good news on the HKM test for multivariate reflected symmetry about an unknown centre
- Revisiting the two-sample runs test
- Visual tests for elliptically symmetric distributions
- Testing for diagonal symmetry based on center-outward ranking
- A new test for symmetry against right skewness
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