Pathological Element-Based Active Device Models and Their Application to Symbolic Analysis
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Publication:5010643
DOI10.1109/TCSI.2010.2097696zbMATH Open1468.94792OpenAlexW2162861151MaRDI QIDQ5010643FDOQ5010643
Carlos Sánchez-López, Francisco V. Fernández, Esteban Tlelo-Cuautle, Sheldon X.-D. Tan
Publication date: 26 August 2021
Published in: IEEE Transactions on Circuits and Systems I: Regular Papers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tcsi.2010.2097696
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