Quantification of model bias underlying the phenomenon of Einstein from Noise

DOI10.5705/SS.202020.0334OpenAlexW3094257659MaRDI QIDQ5072153FDOQ5072153

Authors:

Publication date: 25 April 2022

Published in: STATISTICA SINICA (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.5705/ss.202020.0334

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zbMATH Keywords

extreme value distributionhigh dimensional data analysiscross correlationcryogenic electron microscopymodel biaswhite-noise image

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

• Are discoveries spurious? Distributions of maximum spurious correlations and their applications
• Limiting laws of coherence of random matrices with applications to testing covariance structure and construction of compressed sensing matrices
• Title not available (Why is that?)
• The asymptotic expansion of a ratio of gamma functions
• Distributions of angles in random packing on spheres
• Phase transition in limiting distributions of coherence of high-dimensional random matrices
• Variance Estimation Using Refitted Cross-Validation in Ultrahigh Dimensional Regression

Cited In (1)

• Uncertainty Quantification in Dynamic Image Reconstruction with Applications to Cryo-EM

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