Bayesian process monitoring schemes for the two-parameter exponential distribution
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Publication:5078375
DOI10.1080/03610926.2018.1440307OpenAlexW2790496916WikidataQ130188489 ScholiaQ130188489MaRDI QIDQ5078375FDOQ5078375
Authors: Robert R. van Zyl, A. J. van der Merwe 
Publication date: 23 May 2022
Published in: Communications in Statistics: Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610926.2018.1440307
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Cited In (5)
- Some two-sample tests for simultaneously comparing both parameters of the shifted exponential models
- An adaptive Bayesian scheme for joint monitoring of process mean and variance
- An assessment of the effect of using different mappings and Minkowski distances in joint monitoring of the time-between-event processes
- Phase-II monitoring of exponentially distributed process based on type-II censored data for a possible shift in location-scale
- Simultaneous monitoring of origin and scale in left-bounded processes via depth
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