Bayesian process monitoring schemes for the two-parameter exponential distribution

DOI10.1080/03610926.2018.1440307MaRDI QIDQ5078375zbMATH OpenOpenAlexWikidataFDO

Authors Robert R. van Zyl, A. J. van der Merwe

Publication date 23 May 2022

Published in Communications in Statistics: Theory and Methods (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610926.2018.1440307

zbMATH Keywords

control chartBayesian proceduretwo-parameter exponential distributionrun-lengthJeffrey's prior

Mathematics Subject Classification ID

Statistics (62-XX)

Cites work

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• ON THE EVALUATION OF CONTROL CHART LIMITS BASED ON PREDICTIVE DISTRIBUTIONS
• On Priors Providing Frequentist Validity for Bayesian Inference
• On Some Principles of Statistical Inference
• Shewhart control charts for the scale parameter of a Weibull control variable with fixed and variable sampling intervals
• Statistical Tolerance Regions: Theory, Applications, and Computation
• The case for objective Bayesian analysis
• The interplay of Bayesian and frequentist analysis

Cited in

(5)

• Some two-sample tests for simultaneously comparing both parameters of the shifted exponential models
• An adaptive Bayesian scheme for joint monitoring of process mean and variance
• An assessment of the effect of using different mappings and Minkowski distances in joint monitoring of the time-between-event processes
• Phase-II monitoring of exponentially distributed process based on type-II censored data for a possible shift in location-scale
• Simultaneous monitoring of origin and scale in left-bounded processes via depth

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Uses Software

• StInt

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