Investigating the performance of a family of exponential-type estimators in presence of measurement error
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Cites work
- A new property of Stein procedure in measurement error model
- An Improved Method of Estimating the Correlated Response Variance
- Errors of Measurement in Statistics
- scientific article; zbMATH DE number 3242901 (Why is no real title available?)
- Improved estimation in measurement error models through Stein rule procedure
- Model-based study of families of exponential-type estimators in presence of non response
- Ratio and Product Type Exponential Estimators
- Response Errors in Surveys
- Response Variance and Its Estimation
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