Functional Asplund metrics for pattern matching, robust to variable lighting conditions
DOI10.5566/IAS.2292zbMATH Open1445.62319arXiv1909.01585OpenAlexW3034720525MaRDI QIDQ5115475FDOQ5115475
Authors: Guillaume Noyel, Michel Jourlin
Publication date: 13 August 2020
Published in: Image Analysis & Stereology (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1909.01585
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pattern matchinglogarithmic image processingmathematical morphologydouble-sided probingAsplund metricsmap of Asplund distancesrobustness to lighting variations
Applications of statistics in engineering and industry; control charts (62P30) Image analysis in multivariate analysis (62H35) Functional data analysis (62R10)
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