Reconstruction of thin conductivity imperfections, II. The case of multiple segments

DOI10.1080/00036810500277736MaRDI QIDQ5201453zbMATH OpenOpenAlexWikidataFDO

Authors Elena Beretta, Habib Ammari, E. Francini

Publication date 19 April 2006

Published in Applicable Analysis (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/00036810500277736

zbMATH Keywords

stabilityuniquenessthin conductivity inhomogeneities

Mathematics Subject Classification ID

Boundary value problems for second-order elliptic equations (35J25) Inverse problems for PDEs (35R30) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)

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Cites work

• scientific article; zbMATH DE number 3826314 (Why is no real title available?)
• scientific article; zbMATH DE number 2151305 (Why is no real title available?)
• A general representation formula for boundary voltage perturbations caused by internal conductivity inhomogeneities of low volume fraction
• An accurate formula for the reconstruction of conductivity inhomogeneities.
• Asymptotic formulas for steady state voltage potentials in the presence of conductivity imperfections of small area
• High-Order Terms in the Asymptotic Expansions of the Steady-State Voltage Potentials in the Presence of Conductivity Inhomogeneities of Small Diameter
• Identification of conductivity imperfections of small diameter by boundary measurements. Continuous dependence and computational reconstruction
• Identification of simple poles via boundary measurements and an application of EIT
• Identification of small inhomogeneities of extreme conductivity by boundary measurements: A theorem on continuous dependence
• Reconstruction of Thin Conductivity Imperfections
• Reconstruction of small inhomogeneities from boundary measurements
• Stability results for an inverse problem in potential theory
• Stabilized Numerical Analytic Prolongation with Poles

Cited in

(7)

• Asymptotic expansion of steady-state potential in a high contrast medium with a thin resistive layer
• Investigation of a non-iterative technique based on topological derivatives for fast localization of small conductivity inclusions
• Fast electromagnetic imaging of thin inclusions in half-space affected by random scatterers
• An asymptotic representation formula for scattering by thin tubular structures and an application in inverse scattering
• Reconstruction of Thin Conductivity Imperfections
• The topological ligament in shape optimization: a connection with thin tubular inhomogeneities
• Uniqueness and Lipschitz stability for the identification of Lamé parameters from boundary measurements

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