An optimal design of accelerated life test for exponential distribution
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Publication:5203533
DOI10.1016/0951-8320(91)90036-7zbMATH Open0725.62091OpenAlexW2070303581MaRDI QIDQ5203533FDOQ5203533
Authors:
Publication date: 1991
Published in: Reliability Engineering & System Safety (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/0951-8320(91)90036-7
Cited In (4)
- Optimal sample size allocation for multi-level stress testing with Weibull regression under type-II censoring
- Optimal Allocation for Extreme Value Regression Under Time Censoring
- Optimal experimental designs for accelerated failure time with type I and random censoring
- Optimal sample size allocation for multi-level stress testing with exponential regression under type-I censoring
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