Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution
DOI10.1109/TIT.2019.2903244zbMATH Open1432.62064arXiv1704.07865OpenAlexW2962815495WikidataQ115534494 ScholiaQ115534494MaRDI QIDQ5223987FDOQ5223987
Authors: Elena Castilla, N. Martín, Narayanaswamy Balakrishnan, Leandro Pardo
Publication date: 19 July 2019
Published in: IEEE Transactions on Information Theory (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1704.07865
Parametric hypothesis testing (62F03) Point estimation (62F10) Asymptotic properties of parametric estimators (62F12) Reliability and life testing (62N05) Robustness and adaptive procedures (parametric inference) (62F35)
Cited In (6)
- Robust Wald-type tests based on minimum Rényi pseudodistance estimators for the multiple linear regression model
- An adjusted Grubbs' and generalized extreme studentized deviation
- On the choice of the optimal tuning parameter in robust one-shot device testing analysis
- Power divergence approach for one-shot device testing under competing risks
- Testing linear hypotheses in logistic regression analysis with complex sample survey data based on phi-divergence measures
- Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data
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