Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution

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Publication:5223987

DOI10.1109/TIT.2019.2903244zbMATH Open1432.62064arXiv1704.07865OpenAlexW2962815495WikidataQ115534494 ScholiaQ115534494MaRDI QIDQ5223987FDOQ5223987


Authors: Elena Castilla, N. Martín, Narayanaswamy Balakrishnan, Leandro Pardo Edit this on Wikidata


Publication date: 19 July 2019

Published in: IEEE Transactions on Information Theory (Search for Journal in Brave)

Abstract: This paper develops a new family of estimators, the minimum density power divergence estimators (MDPDEs), for the parameters of the one-shot device model as well as a new family of test statistics, Z-type test statistics based on MDPDEs, for testing the corresponding model parameters. The family of MDPDEs contains as a particular case the maximum likelihood estimator (MLE) considered in Balakrishnan and Ling (2012). Through a simulation study, it is shown that some MDPDEs have a better behavior than the MLE in relation to robustness. At the same time, it can be seen that some Z-type tests based on MDPDEs have a better behavior than the classical Z-test statistic also in terms of robustness.


Full work available at URL: https://arxiv.org/abs/1704.07865







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