Dynamic Erase Voltage and Time Scaling for Extending Lifetime of NAND Flash-Based SSDs

DOI10.1109/TC.2016.2615038zbMATH Open1366.94785MaRDI QIDQ5280459FDOQ5280459

Authors: Jaeyong Jeong, Youngsun Song, Sangwook Shane Hahn, Sung Jin Lee, Jihong Kim 

Publication date: 27 July 2017

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Information storage and retrieval of data (68P20) Fault detection; testing in circuits and networks (94C12)

Cited In (2)

• Improving Read Performance of NAND Flash SSDs by Exploiting Error Locality
• Heating Dispersal for Self-Healing NAND Flash Memory

This page was built for publication: Dynamic Erase Voltage and Time Scaling for Extending Lifetime of NAND Flash-Based SSDs

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q5280459)