Dynamic Erase Voltage and Time Scaling for Extending Lifetime of NAND Flash-Based SSDs

DOI10.1109/TC.2016.2615038MaRDI QIDQ5280459zbMATH OpenFDO

Authors Jaeyong Jeong, Youngsun Song, Sangwook Shane Hahn, Sung Jin Lee, Jihong Kim

Publication date 27 July 2017

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Information storage and retrieval of data (68P20) Fault detection; testing in circuits and networks (94C12)

Cited in

(2)

• Improving Read Performance of NAND Flash SSDs by Exploiting Error Locality
• Heating Dispersal for Self-Healing NAND Flash Memory

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