Models based on the Weibull-Gnedenko distribution for the description of the degradation of functional parameters of electronic devices

MaRDI QIDQ5369768zbMATH OpenFDO

Authors S. M. Borovikov, E. N. Shneiderov, I. A. Burak

Publication date 18 October 2017

Full work available at URL http://doklady.belnauka.by/jour/article/view/112

Mathematics Subject Classification ID

Reliability and life testing (62N05) Reliability, availability, maintenance, inspection in operations research (90B25)

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